[10a-E311-1~10] 7.2 Applications and technologies of electron beams

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[10a-E311-4] Fabrication and Characterization of Edge-Shaped Specimens for MTF Measurement of TEM Cameras

〇(M1)Soma Ueda¹, Takafumi Ishida^1,2, Yuichi Ishida¹, Koh Saitoh^1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ.)

Keywords:

TEM,MTF