The 87th JSAP Autumn Meeting 2026
Advanced Search

Session Details

Oral presentation7 Beam Technology and Nanofabrication : 7.2 Applications and technologies of electron beams

[10a-E311-1~10]7.2 Applications and technologies of electron beams

Thu. Sep 10, 2026 9:00 AM - 11:45 AM JST
Thu. Sep 10, 2026 12:00 AM - 2:45 AM UTC
E311 (First Year Education Bld. E Block)
9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[10a-E311-1]4D-STEM Virtual Dark-Field Analysis of Deformation-Induced Martensite Distribution in SUS304

〇Junro Takahashi1, Ayuki Yoshizumi1,2, Mitsuharu Yonemura2 (1.NIPPON STEEL TECHNOLOGY Co., Ltd., 2.NIPPON STEEL CORPORATION)
9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)

[10a-E311-2]Quantitative Characterization of Crystallinity in LaB6 Thin Films for Photocathode using TEM

〇(M2)Sota Doke1, Takafumi Ishida1,2, Koh Saitoh1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ.)
9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[10a-E311-3]STEM observation and EDS analysis of CeB6 thermionic cathode used in the SACLA XFEL II

〇(M2)Satoshi Yamamoto1, Takafumi Ishida1,2, Makoto Kuwahara1,2, Koh Saitoh1,2, Kazuaki Togawa3 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS ,Nagoya Univ., 3.RIKEN)
9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[10a-E311-4]Fabrication and Characterization of Edge-Shaped Specimens for MTF Measurement of TEM Cameras

〇(M1)Soma Ueda1, Takafumi Ishida1,2, Yuichi Ishida1, Koh Saitoh1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ.)
10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)

[10a-E311-5]Evaluation of low-voltage dynamic hollow-cone TEM by image simulation

〇Takafumi Ishida1, Koh Saitoh1 (1.Nagoya Univ.)
10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)

[10a-E311-6]Development of an LED-incorporated environmental cell TEM holder

〇Masaki Takeguchi1, Ayako Hashimoto1,2 (1.NIMS, 2.Univ. Tsukuba)
10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[10a-E311-7]Proposal of an electron beam size measurement sample coated with a high-density material

〇(M2)Hayata Yamamoto1, Yasunari Sohda1 (1.Tsukuba Univ.)
11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[10a-E311-8]Improving the temporal resolution of a scanning ultrafast electron microscopy using high repetition laser

〇(M2)Kensuke Miura1, Ryohei Tsuchiya1, Shoji Yoshida1, Jun-ichi Fujita1, Yusuke Arashida1 (1.Univ. Tsukuba)
11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[10a-E311-9]Simulation of backscattered electron signal in gases using a scanning electron microscope

〇Taiyo Kobayashi1, Yasuda Masaaki1 (1.Osaka Met Univ.)
11:30 AM - 11:45 AM JST(2:30 AM - 2:45 AM UTC)

[10a-E311-10]Effects of High Energy X-ray Irradiation on Semiconductor Oscillator Operation

〇Yasuhito Gotoh1, Atsushi Kinomura2, Toshiharu Takahashi2 (1.Kyoto Univ., 2.KURNS, Kyoto Univ.)
Back to Category List