Presentation Information
[10p-C309-7]High crystallinity Ge0.80Sn0.20 epitaxial growth on Si substrate using sputtering method
〇Kousaku Goto1, Shigehisa Shibayama1, Tomo Tanaka2, Yasutomo Omori2, R. H. Saputro3, Hiroyuki Ishii3, Tatsuro Maeda3, Mitsuo Sakashita1, Masashi Kurosawa1, Osamu Nakatsuka1,4 (1.Grad. Sch. Eng., Nagoya Univ., 2.NEC, 3.AIST, 4.IMaSS Nagoya Univ.)
Keywords:
GeSn,sputtering,strain relaxed
