Presentation Information

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)

[10p-E308-5]Time-resolved Electrostatic Force Microscopy under Base Bias Control

〇Kyo Ogino¹, Kaita Takemoto¹, Jo Sato¹, Ryota Ishibashi¹, Takuji Takahashi¹ (1.IIS, Univ. Tokyo)

Keywords:

Time-resolved Electrostatic Force Microscopy,Pump-probe

In time-resolved electrostatic force microscopy (Tr-EFM), the resonant vibration of the cantilever (signal fluctuation) induced by steep pump pulses has been a challenge. In this study, we proposed a nested pulse waveform that keeps the DC component of the electrostatic force constant even during the delay time sweep. Experiments using an SiO2/Si sample confirmed that this method suppresses the large signal fluctuations observed in the conventional unipolar-type waveform.

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