Presentation Information

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[10p-E308-6]Precision Improvement in Time-Resolved Scanning Tunneling Spectroscopy

〇Keisuke Kuboki¹, Yuki Deguchi¹, Osamu Takeuchi¹, Yusuke Arasida¹, Hiroyuki Mogi¹, Shoji Yoshida¹, Hidemi Sigekawa¹ (1.Univ. of Tsukuba.)

Keywords:

Scanning Probe Microscope,Scanning Tunneling Spectroscopy,Time-Resolved Measurement

This study aimed to improve the measurement accuracy of time-resolved scanning tunneling spectroscopy (OPVP-STS). To identify the source of distortion in measurement results, the sample was changed from a semiconductor to a metal (gold). The investigation revealed that minute contamination of the synchronization signal into the bias voltage (~0.1 mV) causes DC bias fluctuations, introducing errors in the measured values. Although complete elimination of this contamination was not achieved, three guidelines for high-accuracy measurement were established: correction using theoretically calculated values, unification of experimental conditions, and cancellation of signal offset.

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