Presentation Information

[11a-N102-3]Photoluminescence Characterization of Low-Temperature-Grown AlGaN-Based UV-B Laser-Diode Active Layers

〇Rintaro Kobayashi1, Takumu Saito1, Rintaro Miyake1, Seiya Kato1, Naoki Kitta1, Ryota Watanabe1, Yuma Miyamoto1, Shion Kamiya1, Tomoya Tanikawa1, Kenta Kitagawa1, Sho Iwayama1, Hideto Miyake2, Satoshi Kamiyama1, Tetsuya Takeuchi1, Motoaki Iwaya1 (1.Meijo Univ., 2.Mie Univ.)

Keywords:

AlGaN-based UV-B laser diode,Photoluminescence (PL),Low-temperature growth

To investigate the effects of low-temperature growth on the active layers of AlGaN-based UV-B laser diodes, excitation-power-dependent photoluminescence (PL) measurements were performed on samples grown at temperatures ranging from 750 to 1000 °C for both the active layer and surrounding layers. The results showed that the sample grown at 775 °C exhibited high PL intensity under both low- and high-excitation conditions, suggesting that the enhanced abruptness of heterointerfaces achieved by low-temperature growth contributes to improved emission properties.