Presentation Information
[11a-N102-8]Characterization of sub-bandgap optical absorption processes in 40-nm-thick AlInN alloys using AlInN/GaN multilayer structures
〇(M2)Mikiya Fukushima1, Haruki Nishihata1, Kouki Noda1, Daichi Imai1, Tetsuya Takeuchi1 (1.Meijo Univ.)
Keywords:
Nitride Semiconductor,Photothermal Deflection Spectroscopy
