Presentation Information

[11a-PB1-8]GaN-based MIS-HEMTs Employing MOCVD-Deposited SiAlN Dielectrics for High-Power and High-Efficiency X-band Power Amplifiers

〇Yuichi Minoura1, Atsushi Yamada1, Toshihiro Ohki1 (1.Fujitsu Ltd.)

Keywords:

GaN,MIS,HEMT