Presentation Information
[11p-E201-8]Fabrication and interface characterization of HfO2 on β-Ga2O3 by confined-space ALD
〇Shodai Ata1, Katsuhiro Furukawa1, Takeshi Yoshimura1,2, Norifumi Fujimura1 (1.Osaka Metro. Univ., 2.Toyohashi Univ. Tech.)
Keywords:
HfO2,Ga2O3,ALD
