Presentation Information

[11p-E201-8]Fabrication and interface characterization of HfO2 on β-Ga2O3 by confined-space ALD

〇Shodai Ata1, Katsuhiro Furukawa1, Takeshi Yoshimura1,2, Norifumi Fujimura1 (1.Osaka Metro. Univ., 2.Toyohashi Univ. Tech.)

Keywords:

HfO2,Ga2O3,ALD