Presentation Information
[8a-A33-1]CVD-MoS2 film formation from PVD-Mo film via oxygen and sulfur-vapor anneals
〇Shunsuke Nozawa1, Naoki Matsunaga1, Jaehyo Jang1, Takuya Hoshii1, Kuniyuki Kakushima1, Hitoshi Wakabayashi1 (1.Science Tokyo)
Keywords:
molybdenum disulfide,transition metal dichalcogenide,chemical vapor deposition
MoS2 is attracting attention as a potential channel material for future FETs. Although sputtering using MoS2 targets, which offer high industrial applicability, has been studied as a film deposition method, electrical properties comparable to those achieved by exfoliation or CVD methods have not been obtained yet. Therefore, in this study, we investigated a method (3-step CVD method) in which a Mo film formed by sputtering is oxidized by oxygen annealing and finally converted into a MoS2 film by sulfur atmosphere annealing, and back-gate FETs are fabricated.
