Presentation Information
[8p-A21-12]Dependence of Protonation-Induced Thermal Conductivity Switching Range on Mosaicity in Epitaxial LaNiO3 Thin Films on Si Substrates
〇Haruka Zaizen1, Haobo Li1,2, Osamu Nakagawara3, Ahrong Jeong4, Hiromichi Ohta4, Hidekazu Tanaka1,2 (1.SANKEN, The Univ. of Osaka, 2.OTRI, 3.I-PEX Piezo Solutions Inc, 4.RIES, Univ. of Hokkaido)
Keywords:
LaNiO3,Silicon substrate,Thermal transistor
The integration of high-quality functional oxide epitaxial thin films on Si substrates is crucial for realizing next-generation electronic and thermal devices. We have previously demonstrated the potential of epitaxial LaNiO3 thin films grown on Si substrates for thermal transistor applications by utilizing reversible modulation of thermal conductivity through protonation. In this presentation, we report that improving the mosaicity of the thin films significantly enhances the thermal switching performance of oxide thin films on Si substrates, achieving performance comparable to that of films grown on oxide substrates.
