Presentation Information
[8p-N101-13]Insitu X-ray diffraction measurement of nanochannel epitaxy and remote epitaxy of GaN
〇Shigeya Naritsuka1, Takahiro Maruyama1, Takuo Sasaki2, Kenji Ohwada2, Norihiro Oshime2, James Harries2 (1.Meijo Univ., 2.QST.)
Keywords:
nanochannel epitaxy,insitu X-ray diffraction measurement,remote epitaxy
