Presentation Information

[8p-N101-13]Insitu X-ray diffraction measurement of nanochannel epitaxy and remote epitaxy of GaN

〇Shigeya Naritsuka1, Takahiro Maruyama1, Takuo Sasaki2, Kenji Ohwada2, Norihiro Oshime2, James Harries2 (1.Meijo Univ., 2.QST.)

Keywords:

nanochannel epitaxy,insitu X-ray diffraction measurement,remote epitaxy