Presentation Information
[9a-A21-1]Impacts of post-deposition hydrogen annealing temperature on the improvement of
SiC MOS interface properties
〇Satoshi Iga1, Takuma Kobayashi1, Masahiro Hara1, Heiji Watanabe1 (1.UOsaka)
Keywords:
semiconductor,SiC MOS structures,interface states
