Presentation Information
[9p-A21-11]Characteristics Evaluation of SiC JFET Differential Amplifier Under High Temperature
〇Daisuke Watanabe1,2, Takuya Matsunaga1,2, Masayuki Yamamoto1,2, Hitoshi Umezawa1, Takahide Sato2, Shin-Ichiro Kuroki3, Yasunori Tanaka1 (1.AIST, 2.Univ. of Yamanashi, 3.Hiroshima Univ.)
Keywords:
4H-SiC,High Temperature,Differential Amplifier
In this study, the frequency characteristics of a differential amplifier circuit using SiC JFETs were evaluated at temperatures ranging from room temperature to 300°C. The results showed that the DC gain gradually decreased as the temperature increased. This is thought to be due to changes in the JFET's transfer characteristics with temperature, leading to a decrease in transconductance. Meanwhile, the cutoff frequency remained unchanged.
