Presentation Information
[9p-A21-8]Evaluation of Martens-Type Time Constants in 4H-SiC MOS Capacitors by Multi-Frequency Admittance Analysis
〇Dai Okamoto1, Mitsuru Sometani2 (1.Toyama Pref. Univ., 2.AIST)
Keywords:
semiconductor,Weak Fermi Level Pinning
