Presentation Information

[9p-N101-6]Investigation of the Temperature Dependence of Oxygen Content in Ga-Na Melts via Electrical Resistance Measurements in the Na-Flux Method

〇Kan Ueda1, Masayuki Imanishi1, Kosuke Murakami1, Shigeyoshi Usami1, Mihoko Maruyama1, Masashi Yoshimura1,2, Yusuke Mori1 (1.Grad. Sch. of Eng. The university of Osaka., 2.ILE, The university of Osaka)

Keywords:

semiconductor,GaN crystal,Na-Flux method