[15a-WL2_301-1~9] 3.7 Optical measurement, instrumentation, and sensor

9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[15a-WL2_301-1] High-contrast photo-induced force microscopy via two-photon excitation

〇Tetsu Tamura¹, Norihide Sagami¹, Takeru Sasaki¹, Wataru Yamamoto¹, Ryosuke Oketani¹, Kotaro Hiramatsu¹ (1.Kyushu Univ.)

Keywords:

photo-induced force microscopy,atomic force microscopy,nonlinear optics

Photo-induced force microscopy (PiFM) has emerged as a powerful approach for nanoscale chemical imaging. However, conventional PiFM predominantly relies on linear optical excitation, where the desired force signal overlaps with linear backgrounds such as scattered light and photothermal cantilever bending, resulting in reduced chemical contrast. In this study, we integrate nonlinear optical excitation into PiFM to suppress and effectively exclude these linear processes, thereby enhancing image contrast. Compared with the conventional linear PiFM, our method achieves a 2.4-fold improvement in the signal-to-background ratio.