[15p-W9_325-1~12] 11.1 Fundamental properties

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[15p-W9_325-5] X-ray Absorption Fine Structure Study of Oxidation / Reduction Effects and the Electronic State of the Infinite-Layer Cuprate Thin Films of (Ca_0.85Sr_0.15)_1-xLa_xCuO₂

〇Tomoya Shimada¹, Motoki Hayashi¹, Riku Kagawa¹, Hirotaka Okabe², Jumpei G. Nakamura², Hideki Kuwahara¹, Ryosuke Kadono², Kenji Ishii³, Takuya Tsuji⁴, Daiju Matsumura⁴, Masaki Fujita⁵, Tadashi Adachi¹ (1.Sci. and Technol., Sophia Univ, 2.KEK-IMSS, 3.QST, 4.JAEA, 5.IMR, Tohoku Univ)

Keywords:

Infinite-layer cuprate,X-ray absorption fine structure,Pulsed laser deposition

To clarify the electronic states of the infinite-layer cuprate, (Ca_0.85Sr_0.15)_1-xLa_xCuO₂ thin films were grown on LSAT substrates by pulsed laser deposition, followed by oxidation and reduction annealing. Electrical resistivity and X-ray absorption fine structure measurements revealed that holes were doped by excess oxygen in the as grown film with x = 0. In contrast, for x = 0.10, holes doped by excess oxygen in the as-grown film compensated for the electrons introduced by La substitution, and the removal of excess oxygen by reduction annealing resulted in the decrease in the electrical resistivity.