[15p-W9_326-1~15] 7.1 X-ray technologies

5:00 PM - 5:15 PM JST(8:00 AM - 8:15 AM UTC)

[15p-W9_326-13] X-ray anomalous transmission at interface of stacking fault defect

〇yoshiki kohmura¹, sawada kei¹, takano hidekazu¹, ishikawa tetsuya¹ (1.RIKEN SPring-8 Center)

Keywords:

x-ray diffraction,semiconductor,Fabry-perot interferometer

X-rays were irradiated onto the stacking fault (SF) interface of a diamond crystal, and the transmitted light was observed near the Bragg reflection condition. At angles lower than the Bragg angle within the Darwin angle range, the X-ray transmittance peaked at a high value nearly twice that of the off-Bragg condition. Numerical calculations using an X-ray Fabry-Perot interferometer, with the perfect crystals sandwiching the SF as reflectors and the SF as a gap, suggested the existence of depleted SFs. It was also suggested that the transmittance increased due to the focusing of X-rays onto the SFs due to the X-ray skid phenomenon.