[15p-WL2_101-1~13] 6.3 Oxide electronics

3:30 PM - 3:45 PM JST(6:30 AM - 6:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[15p-WL2_101-8] Rule of barrier layer to prevent inherent charge transfer in oxide heterostructures

〇(M2)Ryotaro Hayasaka¹, Yuuki Masutake¹, Seitaro Inoue¹, Daisuke Shiga^1,2, Kenich Ozawa², Hiroshi Kumigashira^1,2 (1.IMRAM, Tohoku Univ., 2.IMSS, KEK)

Keywords:

Hetero interface,Synchrotron-radiation resonant photoemission spectroscopy,Charge transfer