[16a-M_B104-1~10] 6.6 Probe Microscopy

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[16a-M_B104-5] Frequency response measurements on semiconductor in KFM

〇Ryota Fukuzawa¹, Masakazu Nakamura¹ (1.NAIST)

Keywords:

Kelvin probe force microscopy,interface states