The 73rd JSAP Spring Meeting 2026
Advanced Search

Session Details

Oral presentation6 Thin Films and Surfaces : 6.6 Probe Microscopy

[16a-M_B104-1~10]6.6 Probe Microscopy

Mon. Mar 16, 2026 9:30 AM - 12:30 PM JST
Mon. Mar 16, 2026 12:30 AM - 3:30 AM UTC
M_B104 (Main Bldg.)
9:30 AM - 10:00 AM JST(12:30 AM - 1:00 AM UTC)

[16a-M_B104-1][The 10th Thin Film and Surface Physics Division Paper Award Speech] Molecular-Resolution Imaging of Ionic Liquid/Alkali Halide Interfaces with Varied Surface Charge Densities via Atomic Force Microscopy

Yifan Bao1, Yuto Nishiwaki1, Touma Kawano1, Toru Utsunomiya1, Hiroyuki Sugimura1, 〇Takashi Ichii1 (1.Kyoto Univ.)
10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)

[16a-M_B104-2]Development of tip-enhanced Raman spectroscopy based on liquid FM-AFM (2)

〇Masanao Ito1, Kei Kobayashi1 (1.Kyoto Univ.)
10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)

[16a-M_B104-3]Detection of nanosecond dielectric thermal response using SNDM

〇Yasuo Cho1, Kohei Yamasue2 (1.Tohoku Univ. NICHe, 2.Tohoku Univ. RIEC)
10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)

[16a-M_B104-4]Temperature-controlled local CV profiling of nitrided SiO2/SiC by time-resolved scanning nonlinear dielectric microscopy

〇Kohei Yamasue1, Yasuo Cho2 (1.RIEC, Tohoku Univ., 2.NICHe, Tohoku Univ.)
10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[16a-M_B104-5]Frequency response measurements on semiconductor in KFM

〇Ryota Fukuzawa1, Masakazu Nakamura1 (1.NAIST)
11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-6]Light-assisted local capacitance-voltage profiling of SiO2/SiC using scanning nonlinear dielectric microscopy

〇(M1)Akihiro Isaka1,2, Nobuhide Yokota3, Kohei Yamasue2 (1.Tohoku Univ., 2.RIEC, Tohoku Univ., 3.Shizuoka Univ.)
11:30 AM - 11:45 AM JST(2:30 AM - 2:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-7]Investigation of sweep-time dependence in local MOS CV profiles obtained by time-resolved scanning nonlinear dielectric microscopy

〇Tomohiro Suzuki1,2, Kohei Yamasue2 (1.Tohoku Univ., 2.RIEC, Tohoku Univ.)
11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-8]Comparison of measurements on PN patterned Si using conventional pump-probe KPFM and heterodyne pump-probe KPFM

〇Yuto Mukai1, Yasuhiro Sugawara1, Yanjun Li1 (1.UOsaka)
12:00 PM - 12:15 PM JST(3:00 AM - 3:15 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-9]Machine-Learning-Based Objective Analysis of STS Spectra

〇(DC)Haruto Seki1, Mai Niida1, Kenji Nawa2, Chiharu Mitsumata3, Toyo Kazu Yamada1,4 (1.Chiba Univ., 2.AIST, 3.Tsukuba Univ, 4.Chiba Univ Mol. Chiral. Res.)
12:15 PM - 12:30 PM JST(3:15 AM - 3:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-10]Local Molecular Vibration Measurements within 2D-MOF on Ag(111) using STM-TERS

〇Naoki Hashimoto1,3, Toyo Kazu Yamada1, Masaki Horie2, Adnan Hammud3, Martin Wolf3, Akitoshi Shiotari3 (1.Chiba Univ., 2.Hokkaido Univ., 3.Fritz-Haber Inst.)
Back to Category List