[16a-M_B104-1~10] 6.6 Probe Microscopy

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-M_B104-8] Comparison of measurements on PN patterned Si using conventional pump-probe KPFM and heterodyne pump-probe KPFM

〇Yuto Mukai¹, Yasuhiro Sugawara¹, Yanjun Li¹ (1.UOsaka)

Keywords:

kelvin probe force Microscopy