[16a-W9_325-1~7] 22.1 Joint Session M "Phonon Engineering"

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[16a-W9_325-4] Evaluation of the thermoelectric performance of the cross-plane direction of thin films with nanoscale thickness

〇(DC)Shigeki Saito¹, Yoshihiko Kaneko¹, Masahiro Toyooka¹, Kan Ueji², Satoshi Kusaba¹, Jana Zaumseil³, Kazuhiro Yanagi¹ (1.Tokyo Metropolitan Univ., 2.AIST, 3.Univ. Heiderberg)

Keywords:

nanomaterials,interfacal physics,thermoelectric measurement

Understanding the relationship between the structure of nanomaterial interfaces and thermoelectric properties is essential for improving nanomaterial thermoelectric performance. This work reports the 2ω method for measuring the thermoelectric properties of single-wall carbon nanotube thin films (200 nm) and the thermoelectric voltages of 5-layer MoS₂ in the cross-plane direction. We demonstrate the feasibility of evaluating thermoelectric performance in the cross-plane direction using a combination of the 2ω method and the time-domain thermoreflectance method.