Presentation Information

[16p-M_101-15]Realization of High Carrier Concentration by Suppression of Self-Compensating Defects in Ga-doped CdTe

〇Hayato Tsuru1, Akira Nagaoka1, Isshin Sumiyoshi2, Yoshitaro Nose2, Kenji Yoshino1 (1.Miyazaki Univ., 2.kyoto Univ.)

Keywords:

crystal growth,travelling heater method (THM),CdTe

We fabricated Ga-doped CdTe single crystals using the THM method. In as-grown crystals, the carrier concentration saturated at ~1014 cm-3 due to self-compensation by VCd-related complex defects. However, Cd-atmosphere annealing successfully suppressed these defects and improved PL properties, achieving a high carrier concentration in the 1016 cm-3 range