Presentation Information
[16p-PA3-2]The Influence of External Factors on Hall Measurement Results in Nitride Semiconductors Fabricated on each Si(001) Substrates
〇Kanata Shibuta1, Shyun Koshiba1, Yuuichirou Kuroda1, Koutarou Izumi1, Hagumi Yamanaka1 (1.Kagawa Univ.)
Keywords:
hole measurement