Presentation Information
[16p-PB2-13]Preparation and Characterization of Cr Tips for Non-contact Atomic Force Microscopy
〇Riku Kafuku1, Hidehiro Jonai1, Takao Okubo1, Agus Subagyo1, Eiji Hatta1, Kazuhisa Sueoka1 (1.Graduate School of IST, Hokkaido Univ.)
Keywords:
NC-AFM