The 73rd JSAP Spring Meeting 2026
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Session Details

Poster presentation6 Thin Films and Surfaces : 6.6 Probe Microscopy

[16p-PB2-1~15]6.6 Probe Microscopy

Mon. Mar 16, 2026 2:30 PM - 4:00 PM JST
Mon. Mar 16, 2026 5:30 AM - 7:00 AM UTC
PB2 (Martial Arts Hall (B1F))
English Presentation

[16p-PB2-1]Engineering Molecular Structural Ordering of Self-Assembled Peptides on
Two-Dimensional Layered Nanomaterials

Jinhua Hu1, 〇Linhao Sun2 (1.JiangXi Inst Fashion, 2.Kanazawa Univ)

[16p-PB2-2]Constant Indentation Control for Soft Materials Using AFM Force Measurements

〇Taiga Toshimitsu1, Takahiro Kotani1, Takaharu Okajima1, Feng-Yueh Chan2, Takayuki Uchihashi2 (1.Hokkaido Univ., 2.Nagoya Univ.)

[16p-PB2-3]STM observation of internal structure of TiO2 using field evaporation in Atom Probe Tomography

〇(M1)Shun Harada1, Shu Kurokawa1, Koji Inoue2 (1.Kyoto Univ., 2.Tohoku Univ. IMR)

[16p-PB2-4]Development of STM-ODMR system

〇Ken Motonaga1, Shota Yoshida1, Toyokazu Yamada1 (1.Chiba Univ.)

[16p-PB2-5]In situ AFM analysis on an interface between molten metal flux and semiconductor

〇Taiga Sako1, Yuto Nishiwaki1, Shuji Tokitoh1, Toru Utsunomiya1, Takashi Ichii1 (1.Kyoto Univ.)

[16p-PB2-6]Control of electroosmotic flow for high-speed SICM

〇(B)Kenya Hamabe1, Sinji watanabe2 (1.Kanazawa Univ., 2.Kanazawa Univ. WPI-nanoLSI)

[16p-PB2-7]Development of an Automated SICM Live-Cell Measurement System Based on Optical Image Analysis

〇(M1)Tatsuya Toda1, Shinji Watanabe2 (1.Math. &Phys., Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)

[16p-PB2-8]Development of a SICM Z-Scanner for Observing Various Cellular Surface

〇(M1)Nami Fujii1, Shinji Watanabe2 (1.Kanazawa Univ., 2.Kanazawa Univ., WPI-NanoLSI)

[16p-PB2-9]Measurement of the Sample-Intrinsic Work Function of Gold Surfaces at Atomic Resolution Using Voltage-Pulse Scanning Probe Microscopy

〇Takeshi Susowake1, Yukichi Ito1, Daiki Katsube2, Masayuki Abe3, Eiichi Inami1 (1.Kochi Univ. Tech., 2.JFCC, 3.Osaka Univ.)

[16p-PB2-10]Optimizing Machine Learning Loss Functions for SPM Nanostructure Identification

〇Soichiro Kondo1, Akihiro Tuji2, Hayato Yamashita2, Eiichi Inami1 (1.Kouchikou Univ., 2.Osaka Univ)

[16p-PB2-11]Time-Resolved Potential Measurement Using Heterodyne-Amplitude-Modulation
Pump-Probe Kelvin-probe Force Microscopy

〇Kota Hibi1, Kei Kobayashi1 (1.Kyoto Univ.)

[16p-PB2-12]Nanoscale Changes in Silica Glass Surfaces in a High-Humidity Atmosphere

〇(B)Hikaru Kawamura1, Yuki Araki1, Toyoko Arai1 (1.Kanazawa Univ.)

[16p-PB2-13]Preparation and Characterization of Cr Tips for Non-contact Atomic Force Microscopy

〇Riku Kafuku1, Hidehiro Jonai1, Takao Okubo1, Agus Subagyo1, Eiji Hatta1, Kazuhisa Sueoka1 (1.Graduate School of IST, Hokkaido Univ.)

[16p-PB2-14]Illuminating Light on UHV-LT-STM Sample Surface via Optical Fiber

〇Daisuke Yoshioka1, Tomoya Kashiwagi1, Masaki Horie2, Toyokazu Yamada1 (1.Chiba Univ., 2.Hokkaido Univ.)

[16p-PB2-15]Preparation of planar molecular networks on Au–Ag surface under ambient conditions

〇(B)Yuto Nishiguchi1, Arifumi Okada1, Masamichi Yoshimura2 (1.Kyoto Inst. Tech., 2.Toyota Tech. Inst.)
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