Presentation Information
[16p-PB4-22]Low-Power Task-Oriented ERT for Defect Position Detection in LIG
〇Keiya Minakawa1,2, Reiji Kaneko1, Takashi Ikuno1 (1.Tokyo Univ. of Sci., 2.AIST)
Keywords:
electrical impedance tomography,laser-induced graphene,nondestructive testing