[16p-S2_202-1~14] 2.2 Radiation generators, Detector development, Measurement technology

3:00 PM - 3:15 PM JST(6:00 AM - 6:15 AM UTC)

[16p-S2_202-5] [The 59th Young Scientist Presentation Award Speech] Toward Astronomical X-Ray Polarimetry and Spectroscopy using Curved Silicon Crystal Optics

〇Daiki Ishi¹, Yuichiro Ezoe², Kumi Ishikawa², Masaki Numazawa², Daiki Morimoto², Aoi Ishimure², Shunei Miyauchi², Yuto Ogasawara², Naoya Sera², Yu Fukushima², Kazuhisa Mitsuda³, Kohei Morishita⁴, Kazuo Nakajima⁵ (1.ISAS/JAXA, 2.Tokyo Metropolitan Univ., 3.NAOJ, 4.Kyushu Univ., 5.Tohoku Univ.)

Keywords:

hot plastic deformation,curved silicon crystal,X-ray polarimetry and spectroscopy

We have been developing a new technique for future astronomical X-ray polarimetric and spectroscopic observations based on Bragg reflection from a curved silicon crystal. A silicon wafer is bent using hot plastic deformation, enabling both an expanded reflection energy band and X-ray focusing. Spectroscopic capability is achieved by intentionally offsetting the detector from the focal plane. Using a prototype crystal, we have demonstrated polarization detection, focusing, and spectroscopy. Ray-tracing simulations confirm that the performance is sufficient for future space missions.