Presentation Information

[16p-W8E_307-3]Precise Temperature Measurement Assuming Ⅲ-Ⅴ Compound Semiconductor Single Crystal

〇Daichi Takagi1, Toshinori Taishi1, Masataka Satano2, Koichiro Aoyama2 (1.Shinshu Univ., 2.Sumitomo Electric Semiconductor Materials, Inc.)

Keywords:

semiconductor,Vertical bridgman method