[17a-S4_201-1~13] 6.6 Probe Microscopy

9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)

[17a-S4_201-2] High-Temperature qPlus AFM in Molten Metals via Quadpod Scanner and Hybrid-Loop Frequency Demodulation

〇(D)Yuto Nishiwaki¹, Toru Utsunomiya¹, Takashi Ichii¹ (1.Kyoto Univ.)

Keywords:

molten metals,atomic force microscopy,high-speed AFM

High-temperature (> 200 ℃) atomic-resolution imaging of the molten metals/solid interface is demonstrated using a qPlus sensor. To suppress thermal drift at high temperatures via high-speed scanning, a high-speed tip scanner (“quadpod scanner”) and a wide-bandwidth frequency demodulation technique using a hybrid-loop scheme were developed for large-mass, low-resonant-frequency qPlus sensors. Using these techniques, atomic-scale imaging on the molten Ga/PtGa_x interface at 210 ℃ was achieved.