[17a-S4_201-1~13] 6.6 Probe Microscopy

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[17a-S4_201-4] Improved Force Detection Sensitivity in FM-AFM Using Low-Dielectric-Constant Substrate qPlus Sensors

〇Shuji Tokitoh¹, Yuto Nishiwaki¹, Toru Utsunomiya¹, Takashi Ichii¹ (1.Kyoto Univ.)

Keywords:

atomic force microscopy,qPlus AFM

qPlus AFM enables atomic and molecular scale analysis of interfaces even in high-viscosity, opaque liquids. Conventional AFM using silicon cantilevers typically employs optical lever methods for displacement detection. Compared to these, qPlus AFM exhibits lower force detection sensitivity. This study focused on improving force detection sensitivity to achieve high-speed, wide-band operation for qPlus AFM. Three approaches were implemented: modifying the operational amplifier used in the preamplifier, reducing the dielectric constant of the mounting substrate for the quartz crystal (QTF), and cutting the QTF tip. These resulted in successfully enhancing force detection sensitivity.