Presentation Information

[17p-S2_204-17]A Study on an Accuracy Validation Method for Non-Rigid Registration between APT Data and STEM Tomography Data Using Atomic-Scale Simulated Datasets

〇(M1)Akito Mie1, Taisei Bessho1, Kazunori Iwamitsu1, Yoshito Otake1, Zentaro Akase1, Shigetaka Tomiya1 (1.naist)

Keywords:

3D-Atom probe tomography,Electron Beam Tomography,Accuracy verification

The purpose of this study is to establish a method for validating the accuracy of non-rigid registration between APT data and STEM tomography data. Because the true atomic positions are unknown in experimental data, a pair of simulated APT and STEM tomography datasets assuming known atomic positions was constructed. Non-rigid registration was then applied to the APT data after introducing known local distortions, and an accuracy validation methodology is discussed based on the results.