Presentation Information
[18a-PB3-6]Development of fluorescence mode XAFS measurement system with mxdCMOS detector
〇Tomoya Uruga1,2, Takuma Kaneko1,2, Togo Kudo2, Kazuo Kobayashi2, Toshiaki Tosue3, Hideto Imai1,4, Yoshiharu Uchimoto1, Takaki Hatsui3 (1.Kyoto Univ., 2.JASRI, 3.RIKEN, 4.FC-Cubic)
Keywords:
XAFS,fluorescence mode XAFS,X-ray detector
The XAFS method is a powerful analytical method that obtains chemical state and local structure information by measuring the X-ray absorption spectra of the elements in the sample. We have been developing a rapid fluorescence XAFS measurement system for dilute samples. In this presentation, we report the results of a feasibility study for a rapid fluorescence XAFS measurement system using the monolithic multi-element silicon drift detector mxdCMOS.