[18a-WL1_201-1~8] 6.4 Thin films and New materials

10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)

[18a-WL1_201-3] In-situ XRD Study of SmH_x Thin Films during Electrochemical Hydrogenation/Dehydrogenation

〇Tetsuroh Shirasawa¹, Kota Yamada², Nanase Takahashi², Minseok Kim², Yuichiro Yamashita^1,2, Takashi Yagi^1,2, Yuzo Shigesato² (1.AIST, 2.Aoyama Gakuin Univ.)

Keywords:

Metal hydride,Thin film,in-situ observation

Thermal conductivity switches, which enable reversible control of thermal conductivity by external fields or chemical reactions, have attracted increasing attention. We have focused on switchable mirror thin films that undergo reversible phase transitions during hydrogenation and dehydrogenation, and previously reported an approximately tenfold change in thermal conductivity in SmH_x thin films. In this study, synchrotron in-situ XRD measurements were performed during electrochemical hydrogenation and dehydrogenation of Pd-coated SmH_x thin films. A clear correlation between the electrochemical current and structural changes was directly observed, suggesting that the structure previously interpreted as a two-phase coexistence is attributable to the formation of an Sm₃H₇ phase.