Presentation Information
[18p-S2_201-4]Epitaxial growth of Mn4−xZnxN films and evaluation of their magnetic properties
〇Ren Kobayashi1, Tomohiro Yasuda1, Aoi Hatate1, Yuki Sobukawa1, Soshi Akita1, Kenta Amemiya2, Takashi Suemasu1 (1.Univ. of Tsukuba, 2.KEK)
Keywords:
Mn,magnetization compensation,X-ray magnetic circular dichroism (XMCD)
Mn4-xZnxN thin films (x = 0-0.6) were grown epitaxially on SrTiO3 (001) substrates by molecular beam epitaxy. XRD and RHEED confirmed (001)-oriented epitaxial growth for all samples. Anomalous Hall effect measurements showed a sign reversal between x = 0.1 and 0.6, suggesting the presence of magnetization compensation.
