The 73rd JSAP Spring Meeting 2026

The 73rd JSAP Spring Meeting 2026

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15 Crystal Engineering : 15.7 Crystal characterization, impurities and crystal defects

Oral presentation

[16a-W8E_307-1~10]15.7 Crystal characterization, impurities and crystal defects

Mon. Mar 16, 2026 9:00 AM - 11:45 AM JST
Mon. Mar 16, 2026 12:00 AM - 2:45 AM UTC

W8E_307 (West Bldg. 8)

Chair : Satoshi Iwamoto(Univ. of Tokyo), Koji Sueoka(Okayama Pref. Univ.), Eiji Kamiyama(GlobalWafers Japan)

Poster presentation

[16p-PA5-1~4]15.7 Crystal characterization, impurities and crystal defects

Mon. Mar 16, 2026 2:30 PM - 4:00 PM JST
Mon. Mar 16, 2026 5:30 AM - 7:00 AM UTC

PA5 (Arena (1F))

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