Presentation Information

[III-01]Liquefaction Assessment Using Dynamic Probing and Electrical Logging

*Yasutoshi ohno1, yoshinobu MURATA2, Kenji SHIMOSAKA3, Atsushi YASHIMA2, Kasuhide SAWADA2 (1. Taiyo Kisokogyo Co., Ltd, 2. GIFU University, 3. TODA Corporation)

Keywords:

Dynamic probing,Electrical Logging,Nd-value,Fine fraction content