Presentation Information
[22-04]Super-stealth dicing with nanometric precision
*Lei Wang1, Zhen-Ze Li2, Xin-Jing Zhao1, Wei Gong1, Qing Wang1, Wei-Wei Xu3 (1. Jilin University (China), 2. Tsinghua University (China), 3. Jilin Engineering Normal University (China))
Keywords:
super-stealth dicing,O-FIB,Optical farfield-induced nearfield breakdown
C000260