Presentation Information

[6-06]Pulse-to-pulse characterization of ultrafast charge emission and ablation depth profiles in femtosecond laser ablation process

Ryo Tamaki1,2, Koki Kumagai1, Ryoya Gotoh1, Gaku Asai3, Yuichi Takigawa3, *Ikufumi Katayama1 (1. Yokohama National University (Japan), 2. Kanagawa Institute of Industrial Science and Technology (Japan), 3. Nikon Corporation (Japan))

Keywords:

terahertz radiation,femtosecond laser ablation,spectral domain optical coherent tomography

C000022