Session Details
Metrology
Mon. Apr 21, 2025 3:45 PM - 5:00 PM JST
Mon. Apr 21, 2025 6:45 AM - 8:00 AM UTC
Mon. Apr 21, 2025 6:45 AM - 8:00 AM UTC
213 (Conference Center)
Session Chair: Motoharu Fujigaki (University of Fukui)
[OPTM2-01]Separation Method of Support-Induced Deformation Errors for Optical Components Based on Rotation Calibration and Model Correction
*Xiaochuan Hu1,2,3, Xi Hou1,2,3, Wei Huang1,2,3, Yinhua Zhang1,2,3, Yuancheng Zhao1,2, Shuai Zhang1,2 (1. National Key Laboratory of Optical Field Manipulation Science and Technology, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China, 2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China, 3. University of Chinese Academy of Sciences, Beijing 100049, China)
[OPTM2-02]Calibration method for broadband optical angle measurement
*Hiraku Matsukuma1, Sota Iguchi1, Ryo Sato1, Wei Gao1 (1. Tohoku University)
[OPTM2-03]Proposal of an Error Correction Method for the Laser Triangulation Measurement on Optically Non-Cooperative Surfaces
*Megumi Yamamoto1, Marcus Petz2, Rainer Tutsch2 (1. The University of Tokyo, 2. Technical University of Braunschweig)
[OPTM2-04]Chromatic confocal microscopy with galvanometer scanning and CNN-based deconvolution for precise full-field surface profilometry
Wei-Chi Hung1, Ching-Chia Yen1, Han-Ju Tsai1, *Feng-Tse Chan1, Liang-Chia Chen1 (1. National Taiwan University, Department of Mechanical Engineering)
[OPTM2-05]Evaluation of the loss in measurements accuracy and spatial resolution in diffuse back-illumination extinction imaging
*Julien Manin1, Kevin Wan1, Junghwa Yi1 (1. Sandia National Laboratories)