Presentation Information
[Th2-P43-10]Comprehensive study of optoelectronic reciprocity relation and diode ideality factor under light irradiation through EL and PL measurements
*Meita Asami1, Kentaroh Watanabe1, Yoshiaki Nakano2, Masakazu Sugiyama1 (1. RCAST, The University of Tokyo (Japan), 2. School of Engineering, The University of Tokyo (Japan))