Presentation Information
[Tu2-P31-06]Analysis of crystal defects inside mono-cast Si ingot using PL imaging
*Hidetaka Hirono1, Hitoshi Matsuo2, Hideyoshi Tanabe2, Noritaka Usami1,3,4 (1. Graduate School of Engineering, Nagoya University (Japan), 2. Kyocera corporation (Japan), 3. InFuS, Nagoya university (Japan), 4. IMaSS, Nagoya university (Japan))