Presentation Information
[C-10-07]極薄 Si 層のゼーベック係数に与える表面ラフネスの効果
〇Hiroya Ikeda1, Yudai Yoshimori1, Yukino Nunome1, Khotimatul Fauziah2, Faiz Salleh3, Hiromu Hamasaki1 (1. Shizuoka Univ., 2. BRIN, 3. Univ. Malaya)
Keywords:
thermoelectric,silicon,surface roughness,Seebeck coefficient,nanostructure