Presentation Information
[B-4-37]Comparative Evaluation of EMC Stress in a Simulated DUT at the GHz Frequencies
〇Hiroki Ito1, Atsushi Arai2, Hisanori Sugimoto3, Takanori Uno4, Yusuke Yano5 (1. AISIN CORPORATION, 2. TOYO EMC Engineering, 3. KEC Electronic Industry Development Center, 4. DENSO EMC ENGINEERING SERVICE CORPORATION, 5. Nagoya Institute of Technology)
Keywords:
ISO 11452-2,ISO 11452-11,Automotive Electronic Components,Comparative Evaluation of Stress,GHz Frequencies,Immunity Test,EMS
In this study, a comparative evaluation was conducted on the difference in electromagnetic stress induced inside a simulated DUT in the GHz frequencies between the ALSE method (ISO 11452-2) and the RVC method (ISO 11452-11), both of which are used for radiated immunity testing of automotive electronic equipment. A DUT consisting of a metallic enclosure with apertures and an internal mock PCB was constructed, and the induced voltage was measured when electromagnetic disturbance was applied over the frequency range of 1–6 GHz. Using transmission characteristics obtained by a vector network analyzer (VNA) and field calibration data, the induced voltage under a test field strength of 100 V/m was calculated and compared for both methods. The results showed that, above 2 GHz, the RVC method imposes an average of 7.73 dB higher electromagnetic stress than the ALSE method. Furthermore, analysis of the reception characteristics of the simulated DUT revealed that, in the ALSE method, a mismatch between the antenna irradiation direction and the direction of maximum coupling of the DUT becomes more pronounced at higher frequencies. These findings suggest that, while the ALSE method depends on the incident antenna direction in the high-frequency range, the RVC method can simulate electromagnetic influence from all directions.