Presentation Information

2:00 PM - 2:15 PM JST(5:00 AM - 5:15 AM UTC)

[B-4-37]Comparative Evaluation of EMC Stress in a Simulated DUT at the GHz Frequencies

〇Hiroki Ito¹, Atsushi Arai², Hisanori Sugimoto³, Takanori Uno⁴, Yusuke Yano⁵ (1. AISIN CORPORATION, 2. TOYO EMC Engineering, 3. KEC Electronic Industry Development Center, 4. DENSO EMC ENGINEERING SERVICE CORPORATION, 5. Nagoya Institute of Technology)

Keywords:

ISO 11452-2,ISO 11452-11,Automotive Electronic Components,Comparative Evaluation of Stress,GHz Frequencies,Immunity Test,EMS

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