Presentation Information
[B-4-44]Semiconductor EMC Modeling Method Using Complex Least Squares and Surrogate Models
〇Koji Ichikawa1, Tetsuya Ishii2 (1. Nagoya Institute of Technology, 2. Keisoku Engineering System Co., Ltd)
Keywords:
Conducted Emission Macro-model,Surrogate Model,Complex Least Squares Method,Front-loading Design,Latin Hypercube Sampling / LH
With the increasing sophistication of automobiles, semiconductor "EMC macro-models" have become essential for "front-loading design" to predict noise at the early design stage. This paper proposes a new semiconductor EMC modeling method that integrates the complex least squares method and surrogate models, based on existing EMC evaluation boards and conventional EMC modeling methods. This approach does not require complex, dedicated evaluation environments, enabling easy modeling by equipment designers and contributing to the widespread use of EMC macro-models.