[B-4] Electromagnetic Compatibility

4:00 PM - 4:15 PM JST(7:00 AM - 7:15 AM UTC)

[B-4-44] Semiconductor EMC Modeling Method Using Complex Least Squares and Surrogate Models

〇Koji Ichikawa¹, Tetsuya Ishii² (1. Nagoya Institute of Technology, 2. Keisoku Engineering System Co., Ltd)

Keywords:

Conducted Emission Macro-model,Surrogate Model,Complex Least Squares Method,Front-loading Design,Latin Hypercube Sampling / LH

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