Presentation Information
[PS-04-16]Comparative Analysis of Abnormal Degradation Mechanisms in 4H-SiC JMOS and VDMOS under Repetitive Avalanche Stress across Various Temperatures
〇YI-PIN LEE1, Kung-Yen Lee1, Yan-Yu Wen1, Jung-Chieh Chen1, Chun-Wei Yeh1, Tien-Chin Shih1, Eugene Lin2, Aaron Chung2 (1. National Taiwan Univ. (Taiwan), 2. Chroma ATE Inc. (Taiwan))
