[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

2:18 PM - 2:20 PM JST(5:18 AM - 5:20 AM UTC)

[SO-PS-02-25] Effects of Proton Irradiation on the Transport, Switching, and Reliability Characteristics of Al_0.8Sc_0.2N Ferroelectric Capacitors

〇Yoojin Lim¹, Juno Bae¹, Hyeongjun Joo¹, Jongmin Park¹, Dongseok Kim², Geonwook Yoo¹ (1. Soongsil Univ. (Korea), 2. Korea Atomic Energy Research Institute (KAERI) (Korea))