講演情報

[24a-71B-5]Observation of impurity band in (InFe)(SbBi) ferromagnetic semiconductor using infrared magnetic circular dichroism spectroscopy

〇Kota Ejiri1, Yota Endo1, Kenta Takabayasi1, Masaaki Tanaka2, Pham Nam Hai1 (1.Tokyo Tech, 2.Univ. Tokyo)

キーワード:

Ferromagnetic Semiconductor